Vanderbilt University Design Tool Enables Prediction of Single Event Effects in Microelectronics

Problem:  WMD events may cause crippling damage to microelectronic devices as a result of exposure to ionizing radiation.  Existing phenomenological models to predict the rate of radiation-induced, single event upsets have significant shortcomings when applied to new and emerging CMOS, SiGe, HBT, photodiode and IR FPA technologies with smaller feature sizes.  DTRA has funded basic research to develop a physics-based model that correctly accounts for the distribution of energy deposition about the track left by an ionizing particle and the possible existence of multiple sensitive junctions in each microcircuit.

Results:  Professor Robert Weller of Vanderbilt University has applied the best available nuclear reaction and particle transport models to establish the relationship between energy deposition and electrical effects in semiconductor devices.  The research was initially conceived as fundamentally theoretical and computational.  However, experiments aimed at confirming the theoretical computations of radiation damage induced by nuclear reaction fragments were conducted, thereby increasing the basic understanding of displacement damage effects in semiconductors.

Potential:  The refinement of models to predict single event upsets can assist with the design of hardened devices that are capable of withstanding assault with WMD that produce ionizing radiation.

Transition/Impact:  Monte Carlo code developed during the grant has been transitioned to the CREME website hosted at Vanderbilt.  CREME is a design tool for predicting Single Event Effects in microelectronics that is used by over 800 users.  Usage statistics demonstrate that the release of CREME-MC has led to a substantial increase in usage, suggesting increased utility to the community.  In addition, devices modeled using the Monte Carlo code developed in this project have been fabricated and incorporated in CubeSats, in order to compare the theoretical predictions of single event effects with observed effects in low Earth orbit.

PROTECTION OF SENSITIVE SYSTEMS (TA-3)
HDTRA1-08-1-0034: FUNDAMENTAL ASPECTS OF RADIATION EVENT GENERATION FOR ELECTRONICS AND ENGINEERING RESEARCH
ROBERT WELLER, VANDERBILT UNIVERSITY